J. Jordan-Sweet: search on Z-Library

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1

Challenges of nickel silicidation in CMOS technologies

Breil, Nicolas, Lavoie, Christian, Ozcan, Ahmet, Baumann, Frieder, Klymko, Nancy, Nummy, Karen, Sun, Bing, Jordan-Sweet, Jean, Yu, Jian, Zhu, Frank, Narasimha, Shreesh, Chudzik, Michael

Journal:

Microelectronic Engineering

Year:

2015

Language:

english

File:

PDF, 2.40 MB

english, 2015

2

The influence of alloying on the phase formation sequence of ultra-thin nickel silicide films and on the inheritance of texture

Geenen, F. A., Solano, E., Jordan-Sweet, J., Lavoie, C., Mocuta, C., Detavernier, C.

Journal:

Journal of Applied Physics

Year:

2018

Language:

english

File:

PDF, 3.42 MB

english, 2018

3

Texture of CoSi2 films on Si(111), (110) and (001) substrates

K. De Keyser, C. Detavernier, J. Jordan-Sweet, C. Lavoie

Journal:

Thin Solid Films

Year:

2010

Language:

english

File:

PDF, 1.07 MB

english, 2010

4

Direct observation of amorphous to crystalline phase transitions in nanoparticle arrays of phase change materials

Raoux, Simone, Rettner, Charles T., Jordan-Sweet, Jean L., Kellock, Andrew J., Topuria, Teya, Rice, Philip M., Miller, Dolores C.

Journal:

Journal of Applied Physics

Year:

2007

Language:

english

File:

PDF, 1.09 MB

english, 2007

5

Effect of Al and Cu doping on the crystallization properties of the phase change materials SbTe and GeSb

Raoux, Simone, Salinga, Martin, Jordan-Sweet, Jean L., Kellock, Andrew

Journal:

Journal of Applied Physics

Year:

2007

Language:

english

File:

PDF, 637 KB

english, 2007

6

Heteroepitaxial silicon film growth at 600 °C from an Al–Si eutectic melt

P. Chaudhari, Heejae Shim, Brent A. Wacaser, Mark C. Reuter, Conal Murray, Kathleen B. Reuter, Jean Jordan-Sweet, Frances M. Ross, Supratik Guha

Journal:

Thin Solid Films

Year:

2010

Language:

english

File:

PDF, 2.93 MB

english, 2010

7

Formation and texture of palladium germanides studied by in situ X-ray diffraction and pole figure measurements

Geenen, F.A., Knaepen, W., De Keyser, K., Opsomer, K., Vanmeirhaeghe, R.L., Jordan-Sweet, J., Lavoie, C., Detavernier, C.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.50 MB

english, 2014

8

Controlling the formation and stability of ultra-thin nickel silicides - An alloying strategy for preventing agglomeration

Geenen, F. A., van Stiphout, K., Nanakoudis, A., Bals, S., Vantomme, A., Jordan-Sweet, J., Lavoie, C., Detavernier, C.

Journal:

Journal of Applied Physics

Year:

2018

Language:

english

File:

PDF, 3.26 MB

english, 2018

9

Optimization of Tunneling Magnetoresistance in Perpendicular Magnetic Tunnel Junctions With Co|Pd Reference Layers

Hu, G., Topuria, T., Rice, P. M., Jordan-Sweet, Jean, Worledge, D. C.

Journal:

IEEE Magnetics Letters

Year:

2013

Language:

english

File:

PDF, 428 KB

english, 2013

10

Prediction of recrystallization times in electroplated copper thin films

Treger, Mikhail, Witt, Christian, Cabral, Cyril, Murray, Conal, Jordan-Sweet, Jean, Rosenberg, Robert, Eisenbraun, Eric, Noyan, I.C.

Journal:

Thin Solid Films

Year:

2016

Language:

english

File:

PDF, 2.15 MB

english, 2016

11

Phase formation and texture of thin nickel germanides on Ge(001) and Ge(111)

De Schutter, B., Van Stiphout, K., Santos, N. M., Bladt, E., Jordan-Sweet, J., Bals, S., Lavoie, C., Comrie, C. M., Vantomme, A., Detavernier, C.

Journal:

Journal of Applied Physics

Year:

2016

Language:

english

File:

PDF, 4.71 MB

english, 2016

12

Annealing behavior of atomic layer deposited HfO[sub 2] films studied by synchrotron x-ray reflectivity and grazing incidence small angle scattering

Green, M. L., Allen, A. J., Jordan-Sweet, J. L., Ilavsky, J.

Journal:

Journal of Applied Physics

Year:

2009

Language:

english

File:

PDF, 1.02 MB

english, 2009

13

In situ x-ray diffraction analysis of the C49âC54 titanium silicide phase transformation in narrow lines

Roy, R. A., Clevenger, L. A., Cabral, C., Saenger, K. L., Brauer, S., Jordan-Sweet, J., Bucchignano, J., Stephenson, G. B., Morales, G., Ludwig, K. F.

Journal:

Applied Physics Letters

Year:

1995

Language:

english

File:

PDF, 356 KB

english, 1995

14

Phase transitions in Ge–Sb phase change materials

Raoux, Simone, Cabral, Cyril, Krusin-Elbaum, Lia, Jordan-Sweet, Jean L., Virwani, Kumar, Hitzbleck, Martina, Salinga, Martin, Madan, Anita, Pinto, Teresa L.

Journal:

Journal of Applied Physics

Year:

2009

Language:

english

File:

PDF, 1017 KB

english, 2009

15

[ECS 210th ECS Meeting - Cancun, Mexico (October 29-November 3, 2006)] ECS Transactions - Influence of Alloying Elements on the Formation and Stability of NiSi

Detavernier, Christophe, Deduytsche, Davy, Jordan-Sweet, Jean, Cabral, Cyril, Lavoie, Christian

Year:

2006

Language:

english

File:

PDF, 3.55 MB

english, 2006

16

Epitaxial Formation of a Metastable Hexagonal Nickel–Silicide

De Keyser, K., Van Bockstael, C., Detavernier, C., Van Meirhaeghe, R. L., Jordan-Sweet, J., Lavoie, C.

Journal:

Electrochemical and Solid-State Letters

Year:

2008

Language:

english

File:

PDF, 361 KB

english, 2008

17

Structural and thermoelectric properties of SiGe/Al multilayer systems during metal induced crystallization

Lindorf, M., Rohrmann, H., Span, G., Raoux, S., Jordan-Sweet, J., Albrecht, M.

Journal:

Journal of Applied Physics

Year:

2016

Language:

english

File:

PDF, 3.20 MB

english, 2016

18

Effect of Surface-Influenced Order on Thermal Expansivity of Polymer Thin Films

Thompson, C., Saraf, R. F., Jordan-Sweet, J. L.

Journal:

Year:

1997

Language:

english

File:

PDF, 143 KB

english, 1997

19

Observation of a Precursor during the Crystallization of Amorphous Ni

Sutton, M., Yang, Y. S., Mainville, J., Jordan-Sweet, J. L., Ludwig, K. F., Stephenson, G. B.

Journal:

Physical Review Letters

Year:

1989

Language:

english

File:

PDF, 726 KB

english, 1989

20

Crystallization properties of materials along the pseudo-binary line between GeTe and Sb

Cheng, Huai-Yu, Raoux, Simone, Jordan-Sweet, Jean L.

Journal:

Journal of Applied Physics

Year:

2014

Language:

english

File:

PDF, 2.48 MB

english, 2014

21

Phase change nanodots patterning using a self-assembled polymer lithography and crystallization analysis

Zhang, Yuan, Raoux, Simone, Krebs, Daniel, Krupp, Leslie E., Topuria, Teya, Caldwell, Marissa A., Milliron, Delia J., Kellock, Andrew, Rice, Philip M., Jordan-Sweet, Jean L., Wong, H.-S. Philip

Journal:

Journal of Applied Physics

Year:

2008

Language:

english

File:

PDF, 1.23 MB

english, 2008

22

Controlling Morphology in Polycrystalline Films by Nucleation and Growth from Metastable Nanocrystals

Singh, Ajay, Lutz, Lukas, Ong, Gary K., Bustillo, Karen, Raoux, Simone, Jordan-Sweet, Jean L., Milliron, Delia J.

Journal:

Year:

2018

Language:

english

File:

PDF, 8.72 MB

english, 2018

23

Effects of additive elements on the phase formation and morphological stability of nickel monosilicide films

C. Lavoie, C. Detavernier, C. Cabral Jr., F.M. d’Heurle, A.J. Kellock, J. Jordan-Sweet, J.M.E. Harper

Journal:

Microelectronic Engineering

Year:

2006

Language:

english

File:

PDF, 841 KB

english, 2006

24

Relaxed Si0.7Ge0.3 buffer layers for high-mobility devices

Mooney, P. M., Jordan-Sweet, J. L., Ismail, K., Chu, J. O., Feenstra, R. M., LeGoues, F. K.

Journal:

Applied Physics Letters

Year:

1995

Language:

english

File:

PDF, 306 KB

english, 1995

25

Polymer/metal interfaces studied by carbon near-edge x-ray absorption fine structure spectroscopy

Jordan-Sweet, J. L., Kovac, C. A., Goldberg, M. J., Morar, J. F.

Journal:

The Journal of Chemical Physics

Year:

1988

Language:

english

File:

PDF, 768 KB

english, 1988

26

Manipulating stress in Cu/low-k dielectric nanocomposites

Murray, Conal E., Besser, Paul R., Ryan, E. Todd, Jordan-Sweet, Jean L.

Journal:

Applied Physics Letters

Year:

2011

Language:

english

File:

PDF, 466 KB

english, 2011

27

Real-time x-ray microbeam characterization of electromigration effects in Al(Cu) wires

Wang, P.-C., Noyan, I. C., Kaldor, S. K., Jordan-Sweet, J. L., Liniger, E. G., Hu, C.-K.

Journal:

Applied Physics Letters

Year:

2001

Language:

english

File:

PDF, 286 KB

english, 2001

28

Stress determination through diffraction: establishing the link between Kröner and Voigt/Reuss limits

Murray, Conal E., Jordan-Sweet, Jean L., Bedell, Stephen W., Ryan, E. Todd

Journal:

Powder Diffraction

Year:

2015

Language:

english

File:

PDF, 304 KB

english, 2015

29

Understanding stress gradients in microelectronic metallization

Murray, Conal E., Ryan, E. Todd, Besser, Paul R., Witt, Christian, Jordan-Sweet, Jean L., Toney, Michael F.

Journal:

Powder Diffraction

Year:

2012

Language:

english

File:

PDF, 316 KB

english, 2012

30

Evidence for two-step disordering of the Au(110)-1 × 2 reconstructed surface

D.T. Keane, P.A. Bancel, J.L. Jordan-Sweet, G.A. Held, A. Mak, R.J. Birgeneau

Journal:

Surface Science Letters

Year:

1991

Language:

english

File:

PDF, 67 KB

english, 1991

31

Annealing dependence of diamond-metal Schottky barrier heights probed by hard x-ray photoelectron spectroscopy

Gaowei, M., Muller, E. M., Rumaiz, A. K., Weiland, C., Cockayne, E., Jordan-Sweet, J., Smedley, J., Woicik, J. C.

Journal:

Applied Physics Letters

Year:

2012

Language:

english

File:

PDF, 617 KB

english, 2012

32

Understanding tunneling magnetoresistance during thermal annealing in MgO-based junctions with CoFeB electrodes

Wang, W. G., Ni, C., Miao, G. X., Weiland, C., Shah, L. R., Fan, X., Parson, P., Jordan-sweet, J., Kou, X. M., Zhang, Y. P., Stearrett, R., Nowak, E. R., Opila, R., Moodera, J. S., Xiao, J. Q.

Journal:

Physical Review B

Year:

2010

Language:

english

File:

PDF, 562 KB

english, 2010

33

Scanning x-ray microtopographs of misfit dislocations at SiGe/Si interfaces

Mooney, P. M., Jordan-Sweet, J. L., Christiansen, S. H.

Journal:

Applied Physics Letters

Year:

2001

Language:

english

File:

PDF, 336 KB

english, 2001

34

Higher-K Formation in Atomic Layer Deposited Hf1-XAlxOy

Tapily, K., Consiglio, S., Clark, R., Vasic, R., Wajda, C., Jordan-Sweet, J., Leusink, G., Diebold, A. C.

Journal:

ECS Transactions

Year:

2014

Language:

english

File:

PDF, 1.63 MB

english, 2014

35

[IEEE 2017 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2017.12.2-2017.12.6)] 2017 IEEE International Electron Devices Meeting (IEDM) - An ultra high endurance and thermally stable selector based on TeAsGeSiSe chalcogenides compatible with BEOL IC Integration for cross-point PCM

Cheng, H. Y., Chien, W. C., Kuo, I. T., Lai, E. K., Zhu, Y., Jordan-Sweet, J. L., Ray, A., Carta, F., Lee, F. M., Tseng, P. H., Lee, M. H., Lin, Y. Y., Kim, W., Bruce, R., Yeh, C. W., Yang, C. H., Bri

Year:

2017

Language:

english

File:

PDF, 1.28 MB

english, 2017

36

Effects of alloying elements on cobalt silicide formation

C. Lavoie, C. Cabral, F. M. d’Heurle, J. L. Jordan-Sweet, J. M. E. Harper

Journal:

Journal of Electronic Materials

Year:

2002

Language:

english

File:

PDF, 756 KB

english, 2002

37

Materials and electrical characterization of physical vapor deposited La[sub x]Lu[sub 1−x]O[sub 3] thin films on 300 mm silicon

L. F. Edge, T. Vo, V. K. Paruchuri, R. Iijima, J. Bruley, J. Jordan-sweet, B. P. Linder, A. J. Kellock, T. Tsunoda, S. R. Shinde

Year:

2011

Language:

english

File:

PDF, 861 KB

english, 2011

38

Boron migration due to annealing in CoFeB/MgO/CoFeB interfaces: A combined hard x-ray photoelectron spectroscopy and x-ray absorption studies

Rumaiz, Abdul K., Jaye, C., Woicik, J. C., Wang, Weigang, Fischer, D. A., Jordan-Sweet, J., Chien, C. L.

Journal:

Applied Physics Letters

Year:

2011

Language:

english

File:

PDF, 520 KB

english, 2011

39

In situ characterization of titanium silicide formation: The effect of Mo interlayer, temperature ramp-rate, and annealing atmosphere

Zhang, S.-L., Lavoie, C., Cabral, C., Harper, J. M. E., d’Heurle, F. M., Jordan-Sweet, J.

Journal:

Journal of Applied Physics

Year:

1999

Language:

english

File:

PDF, 1.68 MB

english, 1999

40

Evaluation of Thermal Stability for CMOS Gate Metal Materials

Cabral, C., Lavoie, C., Ozcan, A. S., Amos, R. S., Narayanan, V., Gusev, E. P., Jordan-Sweet, J. L., Harper, J. M. E.

Journal:

Journal of The Electrochemical Society

Year:

2004

Language:

english

File:

PDF, 485 KB

english, 2004

41

Ionic and Electronic Transport in Ag2S Nanocrystal–GeS2 Matrix Composites with Size-Controlled Ag2S Nanocrystals

Robert Y. Wang, Ravisubhash Tangirala, Simone Raoux, Jean L. Jordan-Sweet, Delia J. Milliron

Journal:

Advanced Materials

Year:

2012

Language:

english

File:

PDF, 1.56 MB

english, 2012

42

Evolution of strain relaxation in step-graded SiGe/Si structures

Mooney, P. M., Jordan-Sweet, J. L., Chu, J. O., LeGoues, F. K.

Journal:

Applied Physics Letters

Year:

1995

Language:

english

File:

PDF, 343 KB

english, 1995

43

Texture of NiSi films on Si(001), (111), and (110) substrates

Detavernier, C., Jordan-Sweet, J., Lavoie, C.

Journal:

Journal of Applied Physics

Year:

2008

Language:

english

File:

PDF, 1.45 MB

english, 2008

44

Method to measure the viscosity of nanometer liquid films from the surface fluctuations

Yang, Zhaohui, Lam, Chi-Hang, DiMasi, Elaine, Bouet, Nathalie, Jordan-Sweet, Jean, Tsui, Ophelia K. C.

Journal:

Applied Physics Letters

Year:

2009

Language:

english

File:

PDF, 384 KB

english, 2009

45

Chemistry at interfaces: Electropositive metals on polymer surfaces

Kovac, C. A., Jordan-Sweet, J. L., Goldberg, M. J., Clabes, J. G., Viehbeck, A., Pollak, R. A.

Journal:

IBM Journal of Research and Development

Year:

1988

Language:

english

File:

PDF, 1.12 MB

english, 1988

46

Domain mapping of a Ca-doped manganite

Turner, Joshua J., Jordan-Sweet, Jean L., Upton, Mary, Hill, John P., Tokura, Yoshinori, Tomioka, Yasuhide, Kevan, Stephen D.

Journal:

Applied Physics Letters

Year:

2008

Language:

english

File:

PDF, 408 KB

english, 2008

47

Mitigating residual stress in Cu metallization

Murray, Conal E., Jordan-Sweet, Jean, Todd Ryan, E., Toney, Michael F.

Journal:

Applied Physics Letters

Year:

2012

Language:

english

File:

PDF, 812 KB

english, 2012

48

Electrical Enhancement and Higher-K Engineering in Ultra-Thin Atomic Layer Deposited Hf1-xAlxOy Films

Tapily, K., Consiglio, S., Clark, R. D., Vasi , R., Wajda, C. S., Jordan-Sweet, J., Leusink, G. J., Diebold, A. C.

Journal:

ECS Journal of Solid State Science and Technology

Year:

2014

Language:

english

File:

PDF, 709 KB

english, 2014

49

Texturing and Tetragonal Phase Stabilization of ALD HfxZr1-xO2 Using a Cyclical Deposition and Annealing Scheme

Tapily, K., Consiglio, S., Clark, R. D., Vasic, R., Bersch, E., Jordan-Sweet, J., Wells, I., Leusink, G. J., Diebold, A. C.

Journal:

ECS Transactions

Year:

2012

Language:

english

File:

PDF, 571 KB

english, 2012

50

Stress Gradients Observed in Cu Thin Films Induced by Capping Layers

Murray, Conal E., Besser, Paul R., Witt, Christian, Jordan-Sweet, Jean L.

Journal:

MRS Proceedings

Year:

2009

Language:

english

File:

PDF, 161 KB

english, 2009

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